发明名称 SEMICONDUCTOR DEVICE MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To improve electrical characteristics in a semiconductor device using an oxide semiconductor; or improve reliability in a semiconductor device using an oxide semiconductor.SOLUTION: In a transistor including a first oxide film and an oxide semiconductor film, a pair of electrodes having contact with the oxide semiconductor film and a second oxide film having contact with the oxide semiconductor film and the pair of electrodes, oxygen is added to the first oxide film and the second oxide film having contact with the oxide semiconductor film and the pair of electrodes thereby to reduce oxygen deficiency. By the diffusion of the oxygen in the oxide semiconductor film by a heating treatment and the like reduces oxygen deficiency of the oxide semiconductor film.
申请公布号 JP2014132646(A) 申请公布日期 2014.07.17
申请号 JP20130249153 申请日期 2013.12.02
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 YAMAZAKI SHUNPEI
分类号 H01L21/336;H01L21/8242;H01L21/8247;H01L27/108;H01L27/115;H01L29/786;H01L29/788;H01L29/792;H01L51/50 主分类号 H01L21/336
代理机构 代理人
主权项
地址