发明名称 REGION-OF-INTEREST DETERMINATION APPARATUS, OBSERVATION TOOL OR INSPECTION TOOL, REGION-OF-INTEREST DETERMINATION METHOD, AND OBSERVATION METHOD OR INSPECTION METHOD USING REGION-OF-INTEREST DETERMINATION METHOD
摘要 The present invention aims at efficiently determining the partial regions to be inspected with high sensitivity and measured with high accuracy.;A region-of-interest determination apparatus includes: a calculation unit which calculates the incidence of a defect based on at least a plurality of kinds of defect attribute information regarding defect data, the defect data including an image corresponding to a defect position detected on a specimen by inspection thereof or an image corresponding to a defect position predicted to be likely to develop a defect on the specimen, both images being obtained by imaging; and a region determination unit which extracts the defect data of which the incidence is higher than a predetermined level, and determines the region to be observed or inspected on the specimen based on the extracted defect data.
申请公布号 US2014198975(A1) 申请公布日期 2014.07.17
申请号 US201214239653 申请日期 2012.07.09
申请人 Nakagaki Ryo;Hirai Takehiro;Obara Kenji 发明人 Nakagaki Ryo;Hirai Takehiro;Obara Kenji
分类号 G01N21/95 主分类号 G01N21/95
代理机构 代理人
主权项 1. A region-of-interest determination apparatus comprising: a calculation unit which calculates the incidence of a defect based on at least a plurality of kinds of defect attribute information regarding defect data, the defect data including an image corresponding to a defect position detected on a specimen by inspection thereof or an image corresponding to a defect position predicted to be likely to develop a defect on the specimen, both images being obtained by imaging; and a region determination unit which extracts the defect data of which said incidence is higher than a predetermined level, and determines the region to be observed or inspected on the specimen based on the extracted defect data.
地址 Tokyo JP