HEAT SINK BLADE PACK FOR DEVICE TEST TESTING

摘要

Embodiments of the present disclosure provide an apparatus (100) configured to engage a device (102, 104, 106) for testing the device via automatic test equipment (124). The apparatus (100) includes a heat sink (114), wherein the heat sink (114) comprises a plurality of fins (116) extending from the heat sink (114), and wherein the heat sink (114) is configured to engage the device (102). The apparatus (100) further includes a heat conduction layer (110) coupled to the heat sink (114), a first leg (118) coupled to the heat conduction layer (110), and a second leg (118) coupled to the heat conduction layer (110). The second leg (118) is spaced apart from the first leg (118). A vacuum path (120) is defined through (i) the heat conduction layer (110) and (ii) the heat sink (114). The vacuum path (120) permits the apparatus (100) to engage the device to be tested (102) by the automatic test equipment (124).