发明名称 INSPECTION METHOD FOR DISPLAY PANEL
摘要 Disclosed herein is an inspection method for a display panel according to the present embodiments comprising driving the display panel so as to display a first color having a first reference brightness level; photographing the display panel to obtain a first image including at least one particle region; deriving a first particle brightness level of the particle region contrasted to the first reference brightness level from the first image; driving the display panel so as to display a second color having a second reference brightness level higher than the first reference brightness level; photographing the display panel to obtain a second image containing the particle region; deriving a second particle brightness level of the particle region contrasted to the second reference brightness level; and if the second particle brightness level is higher than the first particle brightness level, determining the particle region to be an internal particle.
申请公布号 US2014198202(A1) 申请公布日期 2014.07.17
申请号 US201314099774 申请日期 2013.12.06
申请人 Samsung Display Co., Ltd. 发明人 KIM Jeong-Keun
分类号 G02F1/13;G09G3/00 主分类号 G02F1/13
代理机构 代理人
主权项 1. An inspection method for a display panel, comprising: driving the display panel so as to display a first color having a first reference brightness level; photographing the display panel to obtain a first image including at least one particle region; deriving a first particle brightness level of the particle region contrasted to the first reference brightness level from the first image; driving the display panel so as to display a second color having a second reference brightness level higher than the first reference brightness level; photographing the display panel to obtain a second image containing the particle region; deriving a second particle brightness level of the particle region contrasted to the second reference brightness level; comparing the first and second particle brightness levels to each other; and determining the particle region to be an internal particle when the second particle brightness level is higher than the first particle brightness level.
地址 Yongin-City KR