发明名称 |
INSPECTION METHOD FOR DISPLAY PANEL |
摘要 |
Disclosed herein is an inspection method for a display panel according to the present embodiments comprising driving the display panel so as to display a first color having a first reference brightness level; photographing the display panel to obtain a first image including at least one particle region; deriving a first particle brightness level of the particle region contrasted to the first reference brightness level from the first image; driving the display panel so as to display a second color having a second reference brightness level higher than the first reference brightness level; photographing the display panel to obtain a second image containing the particle region; deriving a second particle brightness level of the particle region contrasted to the second reference brightness level; and if the second particle brightness level is higher than the first particle brightness level, determining the particle region to be an internal particle. |
申请公布号 |
US2014198202(A1) |
申请公布日期 |
2014.07.17 |
申请号 |
US201314099774 |
申请日期 |
2013.12.06 |
申请人 |
Samsung Display Co., Ltd. |
发明人 |
KIM Jeong-Keun |
分类号 |
G02F1/13;G09G3/00 |
主分类号 |
G02F1/13 |
代理机构 |
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代理人 |
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主权项 |
1. An inspection method for a display panel, comprising:
driving the display panel so as to display a first color having a first reference brightness level; photographing the display panel to obtain a first image including at least one particle region; deriving a first particle brightness level of the particle region contrasted to the first reference brightness level from the first image; driving the display panel so as to display a second color having a second reference brightness level higher than the first reference brightness level; photographing the display panel to obtain a second image containing the particle region; deriving a second particle brightness level of the particle region contrasted to the second reference brightness level; comparing the first and second particle brightness levels to each other; and determining the particle region to be an internal particle when the second particle brightness level is higher than the first particle brightness level. |
地址 |
Yongin-City KR |