发明名称 INSPECTION DEVICE AND INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To provide an inspection device and an inspection method which are capable of quickly inspecting a plurality of objects to be inspected different in appearance and shape.SOLUTION: A inspection device includes a first illumination part irradiating light from a first irradiation direction, a storage part storing a first good product data being image data including the shadow of a good product caused by the light irradiated from the first illumination part, an acquisition part of object to be inspected acquiring a first data of object to be inspected being the image data including the shadow of an object to be inspected caused by the light irradiated from the first illumination part, and an image comparison part comparing the shadow included in the first good product data stored in the storage part with the shadow included in the first data of object to be inspected.
申请公布号 JP2014132230(A) 申请公布日期 2014.07.17
申请号 JP20130000235 申请日期 2013.01.04
申请人 FUJITSU ADVANCED ENGINEERING LTD 发明人 ASAO MASAHIRO
分类号 G01N21/956 主分类号 G01N21/956
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