| 主权项 |
1. A measuring system comprising:
a magnetic field sensor array having a first magnetic field sensor integrated into a semiconductor chip for measuring a first component of a magnetic field in a first spatial direction, and a second magnetic field sensor integrated into a semiconductor chip for measuring a second component of the magnetic field in a second spatial direction; a rotatory encoder that has a plurality of magnets, which with each rotation of the encoder via a plurality of pole pairs, generates a rotation angle-dependent first magnetic field change with a first periodicity in the magnetic field sensor array; and an evaluation circuit connectable to the first magnetic field sensor and the second magnetic field sensor, the evaluation circuit adapted to generate a first signal with the first periodicity from a first measurement signal of the first magnetic field sensor and a second measurement signal of the second magnetic field sensor according to an arctangent function, wherein the rotatory encoder is configured to generate a rotation angle-dependent second magnetic field change with a second periodicity in the magnetic field sensor array, a period of the second periodicity corresponding to a rotation of the encoder, wherein the evaluation circuit is configured to generate a second signal with the second periodicity from the first measurement signal of the first magnetic field sensor and the second measurement signal of the second magnetic field sensor according to an absolute value function, and wherein the evaluation circuit has a logic, which is configured to determine a rotation angle of the encoder based on the first signal and the second signal. |
