发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device capable of reducing the capacity between a gate and a drain.SOLUTION: A semiconductor device comprises: a channel layer 14; an electron supply layer 15 disposed on the channel layer 14; a gate electrode 19 disposed on the electron supply layer 15; a source electrode 17 and a drain electrode 18 disposed on the electron supply layer 15, sandwiching the gate electrode 19 therebetween; and a support layer 13 disposed below the channel layer 14 to support the channel layer 14 and including a cavity 20 located deflected to the drain electrode 18 side with respect to the gate electrode 19.
申请公布号 JP2014132617(A) 申请公布日期 2014.07.17
申请号 JP20130000498 申请日期 2013.01.07
申请人 FUJITSU LTD 发明人 TAKAHASHI TAKESHI
分类号 H01L29/812;H01L21/338;H01L29/778 主分类号 H01L29/812
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