发明名称 Tuning A Parameter Associated With Plasma Impedance
摘要 Systems and methods for tuning a parameter associated with plasma impedance are described. One of the methods includes receiving information to determine a variable. The information is measured at a transmission line and is measured when the parameter has a first value. The transmission line is used to provide power to a plasma chamber. The method further includes determining whether the variable is at a local minima and providing the first value to tune the impedance matching circuit upon determining that the variable is at the local minima. The method includes changing the first value to a second value of the parameter upon determining that the variable is not at the local minima and determining whether the variable is at a local minima when the parameter has the second value.
申请公布号 US2014197731(A1) 申请公布日期 2014.07.17
申请号 US201313740047 申请日期 2013.01.11
申请人 Valcore, JR. John C.;Lyndaker Bradford J. 发明人 Valcore, JR. John C.;Lyndaker Bradford J.
分类号 H05H1/46 主分类号 H05H1/46
代理机构 代理人
主权项 1. A method for tuning a parameter associated with plasma impedance, comprising: receiving information to determine a variable, the information measured at a transmission line, the information measured when the parameter has a first value, the transmission line used to provide power to a plasma chamber via an impedance matching circuit; determining whether the variable is at a local minima; providing the first value to tune the impedance matching circuit upon determining that the variable is at the local minima; changing the first value to a second value of the parameter upon determining that the variable is not at the local minima; and determining whether the variable is at a local minima when the parameter has the second value, wherein the method is executed by a processor.
地址 Berkeley CA US