发明名称 |
PHOTOCONDUCTIVE PHOTODIODE BUILT-IN TEST (BIT) |
摘要 |
<p>A Built-In Test (BIT) for a photoconductive photodiode is performed using the health or characteristics of the photodiode's parasitic capacitance as a proxy for the health or characteristics of the photodiode itself. A failure or degradation of the photodiode manifests as a similar failure or degradation of the parasitic capacitance. Under normal operating conditions, the photoconductive photodiode responds to incident photons from a target by generating a photocurrent signal at its cathode. A processor processes the signals from one or more photodiodes to evaluate characteristics of the target. To perform the BIT, a time-varying voltage signal is applied at the photodiode's anode. This signal is coupled through the parasitic capacitance to produce a test current signal at the photodiode's anode. The processor processes the signal to evaluate the health or characteristics of the parasitic capacitance and thus the photodiode.</p> |
申请公布号 |
EP2564222(B1) |
申请公布日期 |
2014.07.16 |
申请号 |
EP20110709821 |
申请日期 |
2011.02.19 |
申请人 |
RAYTHEON COMPANY |
发明人 |
SCHMIDT, RICHARD, A.;PERLEY, MITCHELL, Q.;KUEHN, ROBERT, A. |
分类号 |
G01R31/26;H05B33/08 |
主分类号 |
G01R31/26 |
代理机构 |
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主权项 |
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