发明名称 |
Semiconductor device, polycrystalline semiconductor thin film, process for producing polycrystalline semiconductor thin film, field effect transistor, and process for producing field effect transistor |
摘要 |
An object of the present invention is to provide a novel semiconductor device which is excellent in stability, uniformity, reproducibility, heat resistance, durability and the like, and can exert excellent transistor properties. The semiconductor device is a thin-film transistor, and this thin-film transistor uses, as an active layer, a polycrystalline oxide semiconductor thin film containing In and two or more metals other than In and having an electron carrier concentration of less than 1×1018/cm3. |
申请公布号 |
US8779419(B2) |
申请公布日期 |
2014.07.15 |
申请号 |
US201213416433 |
申请日期 |
2012.03.09 |
申请人 |
Idemitsu Kosan Co., Ltd. |
发明人 |
Yano Koki;Kazuyoshi Inoue |
分类号 |
H01L29/10 |
主分类号 |
H01L29/10 |
代理机构 |
Millen, White, Zelano & Branigan, P.C. |
代理人 |
Millen, White, Zelano & Branigan, P.C. |
主权项 |
1. A semiconductor device which uses a crystalline oxide as a semiconductor,
wherein the crystalline oxide contains In and two or more metals other than In, and the crystalline oxide has an electron carrier concentration of less than 1×1018/cm3, wherein the number (=[In]) of the atoms of In and the sum (=[X]) of the atoms of the two or more metals other than In contained in the crystalline oxide satisfy the relation 0.0001≦[X]/([X]+[In])<0.1, and the two or more metals other than In are selected from: (a) Zn and Mg, (b) Zn and Cu, (c) Zn and Co, (d) Zn and Ni, (e) Zn and Ca, and (f) Zn and Sr. |
地址 |
Tokyo JP |