发明名称 Packaging substrate with conductive structure
摘要 A packaging substrate with conductive structure is provided, including a substrate body having at least one conductive pad on a surface thereof, a stress buffer metal layer disposed on the conductive pad and a thickness of the stress buffer metal layer being 1-20 μm, a solder resist layer disposed on the substrate body and having at least one opening therein for correspondingly exposing a portion of top surface of the stress buffer metal layer, a metal post disposed on a central portion of the surface of the stress buffer metal layer, and a solder bump covering the surfaces of the metal post.
申请公布号 US8779300(B2) 申请公布日期 2014.07.15
申请号 US201213355311 申请日期 2012.01.20
申请人 Unimicron Technology Corp. 发明人 Hsu Shih-Ping
分类号 H05K1/11;H01L29/40;H01L23/48;H01L23/00;H01L23/498 主分类号 H05K1/11
代理机构 Schmeiser, Olsen & Watts LLP 代理人 Schmeiser, Olsen & Watts LLP
主权项 1. A packaging substrate with conductive structure, comprising: a packaging substrate body having at least one conductive pad on a surface thereof; a stress buffer metal layer disposed on the conductive pad for releasing thermal stresses by the stress buffer metal layer during reflow processes, wherein the stress buffer metal layer is made of one selected from the group consisting of tin (Sn), lead (Pb), copper (Cu), silver (Ag), bismuth (Bi), zinc (Zn), indium (In), and an alloy of a combination of the above-mentioned, and a thickness of the stress buffer metal layer is 1-20 μm; a solder resist layer disposed on the packaging substrate body and having at least one opening therein corresponding in position to the stress buffer metal layer, with a size of the opening smaller than that of the stress buffer metal layer; a metal post disposed on a central portion of the stress buffer metal layer for releasing thermal stresses by the metal post and the stress buffer metal layer during end use; and a solder bump covering the metal post.
地址 Taoyuan TW