发明名称 Semiconductor integrated circuit and drive apparatus including the same
摘要 Disclosed herein is a semiconductor integrated circuit capable of detecting an abnormality that can cause a malfunction in signal transmission via an isolation element and of issuing a stop signal to the target to be controlled. The semiconductor integrated circuit includes a transmission circuit generating and outputting a transmission signal reflecting transmission data supplied from outside, a reception circuit reproducing the transmission data based on a reception signal, an isolation element isolating the transmission circuit from the reception circuit and transmitting the transmission signal as the reception signal, an abnormality detection part detecting an abnormality that can cause a malfunction in signal transmission via the isolation element, and a control part outputting a stop signal if the abnormality detection part detects the abnormality, regardless of the transmission data supplied to the transmission circuit from outside.
申请公布号 US8782503(B2) 申请公布日期 2014.07.15
申请号 US201213535256 申请日期 2012.06.27
申请人 Renesas Electronics Corporation 发明人 Kaeriyama Shunichi
分类号 G06F11/00;G06K19/07;G01R31/265;H04B5/00;G01R31/302 主分类号 G06F11/00
代理机构 McGinn IP Law Group, PLLC 代理人 McGinn IP Law Group, PLLC
主权项 1. A semiconductor integrated circuit comprising: a first transmission circuit generating and outputting a first transmission signal reflecting a first data signal supplied from outside; a first reception circuit reproducing the first data signal based on a first reception signal; a first isolation element isolating the first transmission circuit from the first reception circuit and transmitting the first transmission signal as the first reception signal; an abnormality detection part detecting an abnormality that can cause a malfunction in signal transmission via the first isolation part, and a control part which, upon detection of an abnormality by the abnormality detection part, outputs a stop signal regardless of the first data signal supplied from outside to the first transmission circuit.
地址 Kawasaki-shi, Kanagawa JP