发明名称 |
Magnetic tunneling junction seed, capping, and spacer layer materials |
摘要 |
In one embodiment, a magnetic element for a semiconductor device includes a reference layer, a free layer, and a nonmagnetic spacer layer disposed between the reference layer and the free layer. The nonmagnetic spacer layer includes a binary, ternary, or multi-nary alloy oxide material. The binary, ternary, or multi-nary alloy oxide material includes MgO having one or more additional elements selected from the group consisting of: Ru, Al, Ta, Tb, Cu, V, Hf, Zr, W, Ag, Au, Fe, Co, Ni, Nb, Cr, Mo, and Rh. |
申请公布号 |
US8779538(B2) |
申请公布日期 |
2014.07.15 |
申请号 |
US201213491568 |
申请日期 |
2012.06.07 |
申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
Chen Eugene Youjun;Tang Xueti |
分类号 |
H01L27/22;H01L29/04;H01L47/00;G11B5/33;G11B5/127 |
主分类号 |
H01L27/22 |
代理机构 |
Renaissance IP Law Group LLP |
代理人 |
Renaissance IP Law Group LLP |
主权项 |
1. A magnetic element for a semiconductor device, comprising:
a first reference layer; a free layer; a first nonmagnetic spacer layer disposed between the first reference layer and the free layer; and a seed layer arranged beneath the first reference layer; wherein the seed layer comprises a binary, ternary, or multi-nary alloy oxide material, where the binary, ternary, or multi-nary alloy oxide material comprises MgO having one or more additional elements selected from the group consisting of: Ru, Al, Ta, Tb, Cu, V, Hf, Zr, W, Ag, Au, Fe, Co, Ni, Nb, Cr, Mo, and Rh. |
地址 |
KR |