发明名称 |
Stacked memory device and method of repairing same |
摘要 |
A stacked semiconductor memory device comprises memory cell array layers that are stacked in an inverted wedge shape and have different redundancy sizes from each other. The stacked semiconductor memory device has space for vertical connection between layers, a relatively small size, and a relatively high yield. |
申请公布号 |
US8780656(B2) |
申请公布日期 |
2014.07.15 |
申请号 |
US201113015847 |
申请日期 |
2011.01.28 |
申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
Park Chul-Woo;Hwang Hong-Sun;Kang Sang-Beom;Lee Won-Seok |
分类号 |
G11C7/00;G11C5/02 |
主分类号 |
G11C7/00 |
代理机构 |
Volentine & Whitt, PLLC |
代理人 |
Volentine & Whitt, PLLC |
主权项 |
1. A stacked semiconductor memory device, comprising:
a semiconductor substrate; and a plurality of memory cell array layers stacked on the semiconductor substrate, wherein the plurality of memory cell array layers increase in area as they increase in distance from the semiconductor substrate, and wherein the memory cell array layers provide different amounts of redundant data storage. |
地址 |
Suwon-si, Gyeonggi-do KR |