发明名称 Method for manufacturing a heterostructure aiming at reducing the tensile stress condition of a donor substrate
摘要 A method for manufacturing a heterostructure for applications in the fields of electronics, photovoltaics, optics or optoelectronics, by implanting atomic species in a donor substrate so as to form an embrittlement area therein, assembling a receiver substrate on the donor substrate, wherein the receiver substrate has a larger thermal expansion coefficient than that of the donor substrate, detaching a rear portion of the donor substrate along the embrittlement area so as to transfer a thin layer of interest of the donor substrate onto the receiver substrate, and applying a detachment annealing after assembling and but before detaching, in order to facilitate the detaching. The detachment annealing includes the simultaneous application of a first temperature to the donor substrate and a second temperature different from the first to the receiver substrate; with the first and second temperatures being selected to reduce the tensile stress condition of the donor substrate.
申请公布号 US8778777(B2) 申请公布日期 2014.07.15
申请号 US200913254550 申请日期 2009.09.09
申请人 Soitec 发明人 Kennard Mark
分类号 H01L21/30 主分类号 H01L21/30
代理机构 TraskBritt 代理人 TraskBritt
主权项 1. A method for manufacturing a heterostructure for applications in the field of electronics, photovoltaics, optics or optoelectronics, which comprises: implanting atomic species in a donor substrate so as to form an embrittlement area therein, assembling a receiver substrate on the donor substrate, wherein the receiver substrate has a larger thermal expansion coefficient than that of the donor substrate, detaching a rear portion of the donor substrate along the embrittlement area so as to transfer a thin layer of interest of the donor substrate onto the receiver substrate, and applying a detachment annealing after assembling but before detaching, in order to facilitate the detaching, wherein the detachment annealing comprises the simultaneous application of a first temperature to the donor substrate and a second temperature different from the first temperature to the receiver substrate, wherein the first temperature is approximately 300° C., while the second temperature is approximately 80° C.
地址 Bernin FR