发明名称 Burn-in testing apparatus
摘要 A testing apparatus includes a thermal control chamber including a test room, which temperature is controlled within a testing temperature range; a carrier frame including a direction guiding unit installed securely within the test room and formed with one guiding groove and a carrier rod extending through the guiding groove in the direction guiding unit; and a clamping unit mounted on the carrier rod for clamping a display-panel module securely, wherein, movement of the carrier rod transversely within the guiding groove relative to the direction guiding unit results in disposing the display-panel module to extend along one of several testing directions for undergoing a burn-in test.
申请公布号 US8779788(B2) 申请公布日期 2014.07.15
申请号 US201113340758 申请日期 2011.12.30
申请人 Chroma Ate Inc. 发明人 Chen Chi-Ren;Fan Chiang-Cheng;Chen Li-Hsun
分类号 G01R31/10;G01R31/20 主分类号 G01R31/10
代理机构 Rosenberg, Klein & Lee 代理人 Rosenberg, Klein & Lee
主权项 1. A testing apparatus adapted to clamp at least one display-panel module securely such that the display-panel module is disposed adjustably along several testing directions for undergoing a burn-in test, the testing apparatus comprising: a thermal control chamber including a test room, wherein the temperature of said test room is controlled within a testing temperature range; a carrier frame including a direction guiding unit installed securely within said test room and formed with at least one guiding groove, anda carrier rod extending through said guiding groove in said direction guiding unit; anda clamping unit mounted on said carrier rod for clamping the display-panel module securely; wherein, movement of said carrier rod transversely within said guiding groove relative to said direction guiding unit results in disposing the display-panel module to extend along one of the several testing directions.
地址 Tao-Yuan Hsien TW