发明名称 |
Burn-in testing apparatus |
摘要 |
A testing apparatus includes a thermal control chamber including a test room, which temperature is controlled within a testing temperature range; a carrier frame including a direction guiding unit installed securely within the test room and formed with one guiding groove and a carrier rod extending through the guiding groove in the direction guiding unit; and a clamping unit mounted on the carrier rod for clamping a display-panel module securely, wherein, movement of the carrier rod transversely within the guiding groove relative to the direction guiding unit results in disposing the display-panel module to extend along one of several testing directions for undergoing a burn-in test. |
申请公布号 |
US8779788(B2) |
申请公布日期 |
2014.07.15 |
申请号 |
US201113340758 |
申请日期 |
2011.12.30 |
申请人 |
Chroma Ate Inc. |
发明人 |
Chen Chi-Ren;Fan Chiang-Cheng;Chen Li-Hsun |
分类号 |
G01R31/10;G01R31/20 |
主分类号 |
G01R31/10 |
代理机构 |
Rosenberg, Klein & Lee |
代理人 |
Rosenberg, Klein & Lee |
主权项 |
1. A testing apparatus adapted to clamp at least one display-panel module securely such that the display-panel module is disposed adjustably along several testing directions for undergoing a burn-in test, the testing apparatus comprising:
a thermal control chamber including a test room, wherein the temperature of said test room is controlled within a testing temperature range; a carrier frame including
a direction guiding unit installed securely within said test room and formed with at least one guiding groove, anda carrier rod extending through said guiding groove in said direction guiding unit; anda clamping unit mounted on said carrier rod for clamping the display-panel module securely; wherein, movement of said carrier rod transversely within said guiding groove relative to said direction guiding unit results in disposing the display-panel module to extend along one of the several testing directions. |
地址 |
Tao-Yuan Hsien TW |