发明名称 APPARATUS FOR TREATING SUBSTRATE USING PLASMA
摘要 The present invention provides an apparatus for treating a substrate using plasma. The apparatus for treating a substrate includes a chamber provided therein with a processing space; a support unit provided at the processing space to support the substrate; a gas supply unit to supply a process gas into the processing space; a plasma source to generate plasma from the processing gas provided in the processing space; and an observation unit to observe the processing space. The observation unit includes a window to block an imaging hole formed at a sidewall of the chamber and a camera to shoot the processing space through the imaging hole in an outer side of the window. Accordingly, an inside of the chamber may be precisely observed.
申请公布号 KR20140089053(A) 申请公布日期 2014.07.14
申请号 KR20130000319 申请日期 2013.01.02
申请人 SEMES CO., LTD. 发明人 YANG, DAE HYUN;LEE, SEUNG BAE
分类号 H01L21/02;H01L21/205;H01L21/302;H01L21/3065 主分类号 H01L21/02
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