发明名称 |
APPARATUS FOR TREATING SUBSTRATE USING PLASMA |
摘要 |
The present invention provides an apparatus for treating a substrate using plasma. The apparatus for treating a substrate includes a chamber provided therein with a processing space; a support unit provided at the processing space to support the substrate; a gas supply unit to supply a process gas into the processing space; a plasma source to generate plasma from the processing gas provided in the processing space; and an observation unit to observe the processing space. The observation unit includes a window to block an imaging hole formed at a sidewall of the chamber and a camera to shoot the processing space through the imaging hole in an outer side of the window. Accordingly, an inside of the chamber may be precisely observed. |
申请公布号 |
KR20140089053(A) |
申请公布日期 |
2014.07.14 |
申请号 |
KR20130000319 |
申请日期 |
2013.01.02 |
申请人 |
SEMES CO., LTD. |
发明人 |
YANG, DAE HYUN;LEE, SEUNG BAE |
分类号 |
H01L21/02;H01L21/205;H01L21/302;H01L21/3065 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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