发明名称 METHOD OF MANUFACTURING A FIN FET
摘要 <p>A method of manufacturing a FIN FET forms a first active pin having a first line width in a first area on a semiconductor substrate, and a second active pin having a second line width narrower than the first line width in a second region of the semiconductor substrate. A gate oxide layer is formed on surfaces of the first and second active pins through a deposition process. A gate electrode is formed on the gate oxide layer. The FIN FET formed through the above process is highly integrated and represents an excellent electrical characteristic.</p>
申请公布号 KR20140088784(A) 申请公布日期 2014.07.11
申请号 KR20130000722 申请日期 2013.01.03
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, HYE LAN;HYUN, SANG JIN;KANG, SANG BOM;SONG, JAE YEOL;LEE, JUNE HEE
分类号 H01L21/336;H01L29/78 主分类号 H01L21/336
代理机构 代理人
主权项
地址
您可能感兴趣的专利