发明名称 |
COATING THICKNESS MEASURING INSTRUMENT AND METHODS |
摘要 |
A coating thickness measuring instrument has a probe for measuring the thickness of a coating applied to a substrate and producing an output relating to the measured thickness; a memory storing calibration data; and a processor arranged to process the output produced by the probe, together with calibration data stored by the memory, and produce a coating thickness measurement. The memory stores at least two sets of calibration data, each set associated with a different surface profile value and a user may select the set of calibration data to be used by the processor according to the surface profile of the substrate on which a measurement is to be made. This enables a user to make coating thickness measurements on substrates with at least two different, known, surface profiles without having to calibrate the instrument specifically for those surfaces. |
申请公布号 |
US2014195187(A1) |
申请公布日期 |
2014.07.10 |
申请号 |
US201313738809 |
申请日期 |
2013.01.10 |
申请人 |
Sellars Michael Carrington;Walker Joseph J. |
发明人 |
Sellars Michael Carrington;Walker Joseph J. |
分类号 |
G01B21/08;G06F17/00 |
主分类号 |
G01B21/08 |
代理机构 |
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代理人 |
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主权项 |
1. A coating thickness measuring instrument comprising:
a. a probe for measuring a thickness of a coating applied to a surface and producing an output relating to the measured thickness; b. a memory storing calibration data; c. a processor arranged to process the output produced by the probe, together with calibration data stored by the memory, to produce a calibrated coating thickness measurement; and d. wherein the memory stores at least two sets of calibration data, each set associated with a different surface profile value, and a user may select the set of calibration data to be used by the processor according to the surface profile of the surface on which a measurement is to be made. |
地址 |
Manchester GB |