发明名称 OPTICAL SYSTEM AND SURFACE SHAPE MEASUREMENT DEVICE
摘要 PROBLEM TO BE SOLVED: To enable an acquisition of an interference fringe image having an entire surface of a measured surface uniformly focused on, and shorten an entire length of a surface shape measurement device.SOLUTION: An optical system 3 is used in a surface shape measurement device 100 that measures a shape of a measured surface on the basis of an interference fringe to be formed by interfering measurement light reflected upon the measured surface with reference light reflected upon a reference surface, and the optical system 3 is an optical system that converts the measurement light into a wavefront having a predetermined shape and guides the converted measurement light to a measured surface 4. The optical system 3 is composed of, in order far from the measured surface 4, a first lens L1, a second lens L2 having a positive refractive power, and a third lens L3 having a positive refractive power, and the first lens L1 is a meniscus lens with a convex shape on an opposite side of the measured surface 4.
申请公布号 JP2014130073(A) 申请公布日期 2014.07.10
申请号 JP20120287824 申请日期 2012.12.28
申请人 NIKON CORP 发明人 TOMITA KATSUNORI
分类号 G01B9/02 主分类号 G01B9/02
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