发明名称 SAMPLE TEST AUTOMATION SYSTEM
摘要 <p>PROBLEM TO BE SOLVED: To provide a sample test automation system capable of reducing the amount of work of an operator and performing treatment required for each of samples accurately without interruption.SOLUTION: In a sample test automation system, a sample tray 120 in which a plurality of samples 150 can be placed is prepared, an identifier for identifying the sample tray 120 is attached to the sample tray 120, a sample input unit 10 comprises an identifier read device 111 for reading the identifier of the sample tray 120, and switching between information relating to the samples 150 is performed on the basis of the read identifier of the sample tray 120.</p>
申请公布号 JP2014130165(A) 申请公布日期 2014.07.10
申请号 JP20140077312 申请日期 2014.04.03
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 SASAKI TAKAHIRO;TAKAHASHI KENICHI;OGA HIROSHI;FUKUGAKI TATSUYA;YANO SHIGERU;YASUZAWA KENICHI;HASEGAWA NOZOMI;HANAWA MASAAKI
分类号 G01N35/02;G01N35/00;G01N35/04 主分类号 G01N35/02
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