发明名称 OXIDE SEMICONDUCTOR FILM, OXIDE SEMICONDUCTOR FILM DEPOSITION METHOD AND SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To deposit an oxide semiconductor film having high crystallinity.SOLUTION: An oxide semiconductor film having a single crystal region, which is deposited by a spattering method by using a spattering target which contains a polycrystalline oxide having a plurality of crystal grains is provided. Since the plurality of crystal grain contained in the spattering target has a cleavage plane due to weak crystal binding or a plane which is easy to be cleaved due to weak crystal binding, cleavage planes of the plurality of crystal grains are cleaved by ion collision on the spattering target and tabular spattering grains can be obtained. When the tabular spattering grains obtained are accumulated on a deposition target plane, an oxide semiconductor film is deposited. Since the tabular pattering grains are formed by partial peeling of the crystal grains, the oxide semiconductor film having high crystallinity can be achieved.
申请公布号 JP2014131023(A) 申请公布日期 2014.07.10
申请号 JP20130244556 申请日期 2013.11.27
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 YAMAZAKI SHUNPEI
分类号 H01L29/786;C23C14/08;H01L21/203;H01L21/336;H01L21/8242;H01L27/108 主分类号 H01L29/786
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