主权项 |
1. A system for analyzing a target in a sample, the target being capable of generating an emitted light, the system comprising:
an excitation light source configured to generate an excitation light along an excitation optical path; a plurality of detectors each configured to measure an optical characteristic in an emission light, the plurality of detectors including at least one monochromator-based measurement detector; an excitation monochromator configured to receive the excitation light and to output a selected wavelength component of the excitation light along the excitation optical path when the target in the sample generates the emitted light in response to the excitation light; a sample carrier configured to position the sample to receive the excitation light and to generate the emitted light along one of a plurality of selectable emission optical paths; a cartridge carrier configured to support a plurality of removable cartridges having a common form factor, the cartridges including application cartridges that support filter-based measurements, and to move the removable cartridges to a selected position; an emission monochromator configured to receive the emitted light from the sample along a main measurement optical axis, and to output a selected wavelength component of the emitted light along the selected emission optical path when the selected one of the plurality of selectable emission optical paths includes the emission monochromator; an interface cartridge having the common form factor for removably mounting on the cartridge carrier, the interface cartridge comprising a plurality of emission light ports each positioned to direct the emitted light from the sample along a corresponding one of a plurality of optical paths, where the interface cartridge is positioned to align a selected one of the plurality of optical paths with the main measurement optical axis; and a movable sliding switch mechanism comprising a plurality of optical channels each corresponding to a position on the sliding switch mechanism and each optical channel configured to complete a corresponding one of the plurality of selectable emission optical paths, where the position on the sliding switch mechanism is selected by moving the sliding switch mechanism to align the optical channel for the position with the main measurement optical axis. |