| 发明名称 |
MEMORY TESTING WITH SELECTIVE USE OF AN ERROR CORRECTION CODE DECODER |
| 摘要 |
A method includes directing an access of a memory location of a memory device to an error correction code (ECC) decoder in response to receiving a test activation request indicating the memory location. The method also includes writing a test pattern to the memory location and reading a value from the memory location. The method further includes determining whether a fault is detected at the memory location based on a comparison of the test pattern and the value. |
| 申请公布号 |
US2014195867(A1) |
申请公布日期 |
2014.07.10 |
| 申请号 |
US201313734334 |
申请日期 |
2013.01.04 |
| 申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
Gollub Marc A.;Paulraj Girisankar;Vidyapoornachary Diyanesh B.;Wright Kenneth L. |
| 分类号 |
G11C29/42 |
主分类号 |
G11C29/42 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A method comprising:
in response to receiving a test activation request indicating a memory location of
a memory device:directing an access of the memory location to an error correction code (ECC) decoder;writing a test pattern to the memory location;reading a value from the memory location; anddetermining whether a fault is detected at the memory location based on a comparison of the test pattern and the value. |
| 地址 |
Armonk NY US |
