发明名称
摘要 PROBLEM TO BE SOLVED: To provide a resin molding apparatus which can improve molding quality by measuring the thickness of an article to be molded in advance of resin molding, and then changing the cavity volume. SOLUTION: A thickness measuring unit B comprises: a conveyance plate 9 which conveys an article to be molded 1, where a semiconductor chip is mounted on a substrate, loaded from a loader 25 while holding; an X-Y scanning mechanism 10 which can scan the conveyance plate in the X-Y direction; and a first laser displacement gauge 44 which measures total thickness of the substrate including the semiconductor chip, and a second laser displacement gauge 44 which measures the thickness only of the substrate, that are arranged under the conveyance path of the conveyance plate 9 corresponding to the article to be molded 1. COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP5544585(B2) 申请公布日期 2014.07.09
申请号 JP20100158959 申请日期 2010.07.13
申请人 发明人
分类号 H01L21/56;B29C43/18;B29C43/34;B29C43/58 主分类号 H01L21/56
代理机构 代理人
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