发明名称 Method and system for measuring the resistance of a resistive structure
摘要 Method and system for measuring the resistance of a resistive structure having at least three nodes. A first calibration signal is determined by measuring a voltage at an output of the resistance structure when no calibration current is injected into a third node between the first and second nodes of the structure. A calibration current is then injected into the third node and a second calibration signal is determined. The absolute value of the difference between the first calibration signal and the second calibration signal is determined, the absolute value being proportional to a product of the resistance of the resistive structure and the calibration current.
申请公布号 EP2752672(A1) 申请公布日期 2014.07.09
申请号 EP20140000004 申请日期 2014.01.02
申请人 LINEAR TECHNOLOGY CORPORATION 发明人 ENGL, BERNHARD HELMUT
分类号 G01R17/10;G01R1/20;G01R27/14;G01R27/16;G01R35/00 主分类号 G01R17/10
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