发明名称 PARTICLE INSPECTING SYSTEM FOR CAMERA LENS MODULE
摘要 A foreign matter inspection system for a camera lens module comprises a pre-inspection loading part for loading a lens module to be inspected and transferring the lens module to a predetermined foreign matter inspection position; a foreign matter inspection part for inspecting whether or not foreign matters are attached to both sides of an IR cut-off filter and both sides of an ocular of the lens module transferred to the foreign matter inspection position; and a post-inspection loading part for transferring and loading the lens module finished the inspection. The foreign matter inspection part comprises a reflective inspection module for emitting first illumination light to the outer surface of the IR cut-off filter and collecting the reflected first illumination light to generate a first foreign matter image; a transmittable inspection module emitting second illumination light to the objective lens of the lens module and collecting the second illumination light emitted from the IR cut-off filter after transmitting the lens module to generate a second foreign matter image; and an analysis module for inspecting the foreign matters from the first and second foreign matter images.
申请公布号 KR101416860(B1) 申请公布日期 2014.07.09
申请号 KR20130052483 申请日期 2013.05.09
申请人 KOREA IMAGE TECHNOLGY 发明人 YOO, SANG IL;LEE, IK HEE
分类号 G01N21/958;G01M11/00 主分类号 G01N21/958
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