发明名称 |
Adjusting bit-line discharge time in memory arrays based on characterized word-line delay and gate delay |
摘要 |
A memory tracking circuit controls discharge duration of a tracking bit-line based on (i) a signal received at the far end of a tracking row after a propagation delay and (ii) a signal applied to a transistor-based gate delay. The tracking circuit (i) extends the discharge duration when one or more of (a) the propagation delay and (b) the transistor-based gate delay is shorter than an uncontrolled discharge duration of the tracking bit-line, and (ii) does not extend the discharge duration otherwise. Based on the discharge duration, the tracking circuit activates a reset signal that resets a clock-pulse generator to switch the memory from an access operation to a recess state. Controlling the discharge duration, and consequently the reset signal, based on the propagation delay and the gate delay allows the clock-pulse generator to adjust access times to account for the memory array configuration and process, temperature, and voltage conditions. |
申请公布号 |
US8773927(B2) |
申请公布日期 |
2014.07.08 |
申请号 |
US201213606342 |
申请日期 |
2012.09.07 |
申请人 |
LSI Corporation |
发明人 |
Evans Donald Albert;Chary Rasoju Veerabadra;Stephani Richard John;Ghosh Bijan Kumar;Steele Ronald Brian |
分类号 |
G11C7/00;G11C7/22 |
主分类号 |
G11C7/00 |
代理机构 |
Mendelsohn, Drucker & Dunleavy, P.C. |
代理人 |
Mendelsohn, Drucker & Dunleavy, P.C. ;Brown Craig M.;Mendelsohn Steve |
主权项 |
1. An integrated circuit having a memory device comprising:
a memory array of memory cells arranged in rows and columns; a clock-pulse generator configured to generate a clock pulse for controlling access to the memory cells in the memory array; and a tracking circuit configured to control a discharge duration of a tracking bit-line of the memory device based on a word-line delay and a gate delay, wherein duration of the clock pulse is controlled based on the controlled discharge duration. |
地址 |
San Jose CA US |