发明名称 Methods and apparatus to scan a targeted portion of an input device to detect a presence
摘要 A method and apparatus perform a first scan of an input device and determine that a first signal profile received through the first scan is outside a range of a reference signal profile. The method and apparatus perform a second scan of the input device responsive to the first signal profile being outside the range of the reference signal profile and use a second signal profile received through the second scan to detect a presence of an input object at least proximate to the input device.
申请公布号 US8773386(B2) 申请公布日期 2014.07.08
申请号 US201213631600 申请日期 2012.09.28
申请人 Cypress Semiconductor Corporation 发明人 Wilson Cole;Wright David G.;Grivna Edward
分类号 G06F3/041 主分类号 G06F3/041
代理机构 代理人
主权项 1. A method comprising: detecting a presence of an input object proximate to a second electrode associated with a second axis of an input device and not detecting the presence of the input object proximate to a first electrode associated with a first axis of the input device, comprising: performing a first scan of the input device, wherein the first scan includes receiving first sensor signals from a plurality of electrodes;determining that a first signal profile that is based on the first sensor signals is outside of a range of a reference signal profile, wherein signal profiles determined to be within the range of the reference signal profile indicate presence of an input object;performing a second scan of the input device responsive to the first signal profile being outside of the range of the reference signal profile, and the detecting the presence of the input object proximate to the second electrode, wherein the second scan includes receiving second sensor signals from another pluraltiy of electrodes; and using the second sensor signals to detect the presence of the input object at least proximate to the first electrode.
地址 San Jose CA US