| 摘要 |
<p>The present technology is for reducing cost and time for test while relieving the fail of a memory device and testing the memory device in a module state or package state. According to the present invention, a test system of the memory device includes a memory device including multiple memory cells but accessing the memory cells corresponding to an address included in test information of a first frequency and activating a fail signal when a fault occurs in the memory cells corresponding to the address; a test device generating test information of a second frequency which is different from the first frequency; and a test medication device generating the test information of the first frequency by receiving the test information of the second frequency and then inputting the information into the memory device and storing a fail address corresponding to the memory cells having the fault when the fail signal is activated.</p> |
