发明名称 Filling cavities in semiconductor structures having adhesion promoting layer in the cavities
摘要 High aspect ratio trenches may be filled with metal that grows more from the bottom than the top of the trench. As a result, the tendency to form seams or to close off the trench at the top during filling may be reduced in some embodiments. Material that encourages the growth of metal may be formed in the trench at the bottom, while leaving the region of the trench near the top free of such material to encourage growth upwardly from the bottom.
申请公布号 US8772155(B2) 申请公布日期 2014.07.08
申请号 US201012948897 申请日期 2010.11.18
申请人 Micron Technology, Inc. 发明人 Haimson Shai;Rozenblat Avi;Horvitz Dror;Rotlain Maor;Drori Rotem
分类号 H01L21/4763;H01L21/44 主分类号 H01L21/4763
代理机构 Dorsey & Whitney LLP 代理人 Dorsey & Whitney LLP
主权项 1. A method comprising: lining a cavity with a lining material; depositing a metal nucleation layer on the lining material; removing the lining material and metal nucleation layer from a portion of a sidewall of the cavity; and after removing the lining material and metal nucleation layer from the portion of the sidewall of the cavity, depositing a metallic material in the cavity covering the lining material, metal nucleation layer, and the portion of the sidewall, the metallic material adjacent to the lining material and substantially filling the cavity.
地址 Boise ID US