发明名称 Semiconductor processing method and semiconductor structure
摘要 A semiconductor processing method that can generate a hole with different diameters, comprising: providing first material and second material different from the first material; and utilizing a etching process to etch the first material and the second material to form a hole through the first material and the second material; wherein the etching process has different etching rates for the first material and the second material such that the hole have different diameters. A semiconductor structure corresponding to the above-mentioned method is also disclosed.
申请公布号 US8772163(B2) 申请公布日期 2014.07.08
申请号 US201213485875 申请日期 2012.05.31
申请人 Nanya Technology Corp. 发明人 Pretti Dennis J.;McDaniel Terrence B.
分类号 H01L21/44;H01L21/461;H01L21/302 主分类号 H01L21/44
代理机构 代理人 Hsu Winston;Margo Scott
主权项 1. A semiconductor processing method that can generate a single hole with different diameters, comprising: providing first material and second material different from the first material; and utilizing a single etching process to etch the first material and the second material to form a single hole through the first material and the second material; wherein the single etching process has different etching rates for the first material and the second material such that the single hole have different diameters; where the single hole includes a second portion, and a third portion under the second portion; wherein the third portion has a diameter smaller than the second portion; where the second portion touches both the first material and the second material, and the third portion only touches the second material.
地址 Kueishan, Tao-Yuan Hsien TW