发明名称 |
Semiconductor processing method and semiconductor structure |
摘要 |
A semiconductor processing method that can generate a hole with different diameters, comprising: providing first material and second material different from the first material; and utilizing a etching process to etch the first material and the second material to form a hole through the first material and the second material; wherein the etching process has different etching rates for the first material and the second material such that the hole have different diameters. A semiconductor structure corresponding to the above-mentioned method is also disclosed. |
申请公布号 |
US8772163(B2) |
申请公布日期 |
2014.07.08 |
申请号 |
US201213485875 |
申请日期 |
2012.05.31 |
申请人 |
Nanya Technology Corp. |
发明人 |
Pretti Dennis J.;McDaniel Terrence B. |
分类号 |
H01L21/44;H01L21/461;H01L21/302 |
主分类号 |
H01L21/44 |
代理机构 |
|
代理人 |
Hsu Winston;Margo Scott |
主权项 |
1. A semiconductor processing method that can generate a single hole with different diameters, comprising:
providing first material and second material different from the first material; and utilizing a single etching process to etch the first material and the second material to form a single hole through the first material and the second material; wherein the single etching process has different etching rates for the first material and the second material such that the single hole have different diameters; where the single hole includes a second portion, and a third portion under the second portion; wherein the third portion has a diameter smaller than the second portion; where the second portion touches both the first material and the second material, and the third portion only touches the second material. |
地址 |
Kueishan, Tao-Yuan Hsien TW |