发明名称 |
Method of fabricating electrical contact |
摘要 |
A method of fabricating an electrical contact comprises the following steps. A substrate having at least a silicon region is provided. At least an insulation layer is formed on the substrate, wherein the insulation layer comprises at least a contact hole which exposes the silicon region. A metal layer is formed on sidewalls and bottom of the contact hole. An annealing process is performed to form a first metal silicide layer in the silicon region nearby the bottom of the contact hole. A conductive layer covering the metal layer and filling up the contact hole is then formed, wherein the first metal silicide layer is transformed into a second metal silicide layer when the conductive layer is formed. |
申请公布号 |
US8772159(B2) |
申请公布日期 |
2014.07.08 |
申请号 |
US201213364289 |
申请日期 |
2012.02.01 |
申请人 |
United Microelectronics Corp. |
发明人 |
Tseng I-Ming;Tsai Tsung-Lung;Chen Yi-Wei |
分类号 |
H01L21/441;H01L29/417 |
主分类号 |
H01L21/441 |
代理机构 |
|
代理人 |
Hsu Winston;Margo Scott |
主权项 |
1. A method of fabricating an electrical contact, comprising:
providing a substrate having at least a silicon region; forming at least an insulation layer on the substrate, wherein the insulation layer comprises at least a contact hole exposing the silicon region and having sidewalls and a bottom surface; forming a metal layer on the sidewalls and the bottom of the contact hole; performing an annealing process to form a first metal silicide layer in the silicon region nearby the bottom of the contact hole; and forming a conductive layer covering the metal layer and filling up the contact hole, wherein the first metal silicide layer is transformed into a second metal silicide layer when forming the conductive layer, wherein a temperature of the annealing process is lower than a temperature applied in a step for forming the conductive layer. |
地址 |
Science-Based Industrial Park, Hsin-Chu TW |