发明名称 |
Manufacturing method of SOI substrate and manufacturing method of semiconductor device |
摘要 |
A manufacturing method of an SOI substrate which possesses a base substrate having low heat resistance and a very thin semiconductor layer having high planarity is demonstrated. The method includes: implanting hydrogen ions into a semiconductor substrate to form an ion implantation layer; bonding the semiconductor substrate and a base substrate such as a glass substrate, placing a bonding layer therebetween; heating the substrates bonded to each other to separate the semiconductor substrate from the base substrate, leaving a thin semiconductor layer over the base substrate; irradiating the surface of the thin semiconductor layer with laser light to improve the planarity and recover the crystallinity of the thin semiconductor layer; and thinning the thin semiconductor layer. This method allows the formation of an SOI substrate which has a single-crystalline semiconductor layer with a thickness of 100 nm or less over a base substrate. |
申请公布号 |
US8772129(B2) |
申请公布日期 |
2014.07.08 |
申请号 |
US201012891271 |
申请日期 |
2010.09.27 |
申请人 |
Semiconductor Energy Laboratory Co., Ltd. |
发明人 |
Miyairi Hidekazu;Shimomura Akihisa;Mizoi Tatsuya;Higa Eiji;Nagano Yoji |
分类号 |
H01L21/46;H01L21/762;H01L27/12;H01L51/00;H01L29/786 |
主分类号 |
H01L21/46 |
代理机构 |
Robinson Intellectual Property Law Office, P.C. |
代理人 |
Robinson Eric J.;Robinson Intellectual Property Law Office, P.C. |
主权项 |
1. A manufacturing method of an SOI substrate, the manufacturing method comprising:
forming a first insulating layer over a semiconductor substrate; forming a second insulating layer over the first insulating layer; forming an ion introduction layer in the semiconductor substrate by applying an ion beam to the semiconductor substrate through the first insulating layer and the second insulating layer; forming a bonding layer over the second insulating layer by a CVD method; bonding the semiconductor substrate to a base substrate with the first insulating layer, the second insulating layer and the bonding layer interposed therebetween; separating a part of the semiconductor substrate at the ion introduction layer, leaving a semiconductor layer over the base substrate; irradiating the semiconductor layer with laser light after the separation step; and thinning the semiconductor layer by etching the semiconductor layer. |
地址 |
Atsugi-shi, Kanagawa-ken JP |