发明名称 Manufacturing method of SOI substrate and manufacturing method of semiconductor device
摘要 A manufacturing method of an SOI substrate which possesses a base substrate having low heat resistance and a very thin semiconductor layer having high planarity is demonstrated. The method includes: implanting hydrogen ions into a semiconductor substrate to form an ion implantation layer; bonding the semiconductor substrate and a base substrate such as a glass substrate, placing a bonding layer therebetween; heating the substrates bonded to each other to separate the semiconductor substrate from the base substrate, leaving a thin semiconductor layer over the base substrate; irradiating the surface of the thin semiconductor layer with laser light to improve the planarity and recover the crystallinity of the thin semiconductor layer; and thinning the thin semiconductor layer. This method allows the formation of an SOI substrate which has a single-crystalline semiconductor layer with a thickness of 100 nm or less over a base substrate.
申请公布号 US8772129(B2) 申请公布日期 2014.07.08
申请号 US201012891271 申请日期 2010.09.27
申请人 Semiconductor Energy Laboratory Co., Ltd. 发明人 Miyairi Hidekazu;Shimomura Akihisa;Mizoi Tatsuya;Higa Eiji;Nagano Yoji
分类号 H01L21/46;H01L21/762;H01L27/12;H01L51/00;H01L29/786 主分类号 H01L21/46
代理机构 Robinson Intellectual Property Law Office, P.C. 代理人 Robinson Eric J.;Robinson Intellectual Property Law Office, P.C.
主权项 1. A manufacturing method of an SOI substrate, the manufacturing method comprising: forming a first insulating layer over a semiconductor substrate; forming a second insulating layer over the first insulating layer; forming an ion introduction layer in the semiconductor substrate by applying an ion beam to the semiconductor substrate through the first insulating layer and the second insulating layer; forming a bonding layer over the second insulating layer by a CVD method; bonding the semiconductor substrate to a base substrate with the first insulating layer, the second insulating layer and the bonding layer interposed therebetween; separating a part of the semiconductor substrate at the ion introduction layer, leaving a semiconductor layer over the base substrate; irradiating the semiconductor layer with laser light after the separation step; and thinning the semiconductor layer by etching the semiconductor layer.
地址 Atsugi-shi, Kanagawa-ken JP