| 摘要 |
PROBLEM TO BE SOLVED: To provide a high performance semiconductor circuit.SOLUTION: A semiconductor circuit 10 according to an embodiment comprises: an operational amplifier AMP with an output connected for negative feedback to an input terminal; a measurement circuit 14 for measuring a capacitive load CL connected in parallel with an output wire 21 of the operational amplifier AMP; a changeover switch 13 connected in parallel with the output wire 21 to disconnect the measurement circuit 14 from the operational amplifier AMP; and a control circuit 15 for changing a drain current flowing through a transistor of the operational amplifier in response to a measurement signal output from the measurement circuit 14. |
