发明名称 |
METHOD FOR LIFTING SILICON SINGLE CRYSTAL |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a method for lifting a silicon single crystal that may regulate a resistibility along a lifting direction of the single crystal within an aimed range and that gives the single crystal of the desired resistibility in high yield for producing an n-type silicon single crystal doped with P by a Czochralski process.SOLUTION: While lifting a silicon single crystal 7 with an Al or In wire 9 inserted in a tubular heat-resistance and heat-insulating protection tube 8 hanged down above a raw material silicon melt 4 doped with P in a crucible 2, Al or In is added to the silicon melt 4 by melting and dropping a part of the wire 9 exposed from the lower end of the protection tube 8.</p> |
申请公布号 |
JP2014125402(A) |
申请公布日期 |
2014.07.07 |
申请号 |
JP20120284815 |
申请日期 |
2012.12.27 |
申请人 |
GLOBALWAFERS JAPAN CO LTD |
发明人 |
HIKASA MITSUAKI;MINAMI TOSHIRO;KASHIMA KAZUHIKO |
分类号 |
C30B29/06 |
主分类号 |
C30B29/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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