发明名称 |
METHOD OF FORMING MANGANESE-CONTAINING FILM, PROCESSING SYSTEM, ELECTRONIC DEVICE PRODUCTION METHOD, AND ELECTRONIC DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method of forming a manganese-containing film by a chemical vapor growth method which can form a manganese-containing film having a film of manganese silicate and/or manganese oxide and being good in adhesiveness with a metal film of an upper layer on the boundary surface between silicon and an oxygen-containing substrate.SOLUTION: A method of forming a manganese-containing film includes steps of (1)heat-treating a substrate 2 containing silicon and oxygen to degas the substrate 2 and (2)forming a metal manganese film 3 on the degassed substrate 2 by a chemical vapor growth method using a gas containing a manganese compound. The film formation temperature in the step (2) is set to be higher than the degas treatment temperature in the step (2). In the step (2), a reductive reaction gas is introduced additionally so as to form a manganese-containing film 7 consisting of an interlayer 4 composed of a film manganese silicate and/or manganese oxide formed in the boundary with the substrate 2 and the metal manganese film 3 formed on the interlayer 4. |
申请公布号 |
JP2014125674(A) |
申请公布日期 |
2014.07.07 |
申请号 |
JP20120285441 |
申请日期 |
2012.12.27 |
申请人 |
TOKYO ELECTRON LTD |
发明人 |
MATSUMOTO KENJI |
分类号 |
C23C16/06;H01L21/3205;H01L21/768;H01L23/532 |
主分类号 |
C23C16/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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