发明名称 SEMICONDUCTOR DEVICE WITH DUAL WORKFUNCTION GATE STACK AND METHOD FOR FABRICATING THE SAME
摘要 <p>The present invention provides a semiconductor device including a dual work function gate stack and a manufacturing method thereof capable of independently controlling each threshold voltage of an N-channel transistor and a P-channel transistor and preventing an effective work function of the gate stack from fluctuating due to a subsequent process. The semiconductor device manufacturing method according to the present invention comprises a step of forming a gate dielectric layer on the front surface of a substrate including a first region and a second region; a step of stacking a first metal containing layer containing a first effective work function adjustment specimen and an anti-reaction layer on the gate dielectric layer; a step of increasing the content of the first effective work function adjustment specimen; a step of removing the anti-reaction layer and the first metal containing layer on the second region; a step of forming a second metal containing layer containing a second effective work function adjustment specimen on the front surface of the second region including the gate dielectric layer; a step of forming a first gate stack on the first region by etching the second metal containing layer, the anti-reaction layer, the first metal containing layer, and the gate dielectric layer; and a step of forming a second gate stack on the second region by etching the second metal containing layer and the gate dielectric layer.</p>
申请公布号 KR20140084914(A) 申请公布日期 2014.07.07
申请号 KR20120154941 申请日期 2012.12.27
申请人 SK HYNIX INC. 发明人 JI, YUN HYUCK;JANG, SE AUG;LEE, SEUNG MI;KIM, HYUNG CHUL
分类号 H01L21/8238;H01L29/78 主分类号 H01L21/8238
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