摘要 |
<p>The present invention relates to a semiconductor integrated circuit including a fuse circuit and an operating method thereof. Provided is a semiconductor integrated circuit including a fuse set array including multiple unit fuse circuits to separately generate a fuse state signal corresponding to a rupture state of an included fuse in response to a common enable signal and each address; a fuse state determining part determining whether multiple fuse state signals outputted from the unit fuse circuits are normal in response to a test signal; and an output driver to output the fuse state signal to a preset internal circuit in response to an output enable signal outputted from the fuse state determining part.</p> |