| 摘要 |
PROBLEM TO BE SOLVED: To provide a solid-state imaging element capable of suppressing deterioration in image quality due to a leakage current to a photoelectric conversion part.SOLUTION: The solid-state imaging element is configured to comprise: a substrate; a p-type photoelectric conversion part which is formed on the light incident side of the substrate and generates a signal charge corresponding to the quantity of light; a p-type transparent electrode provided on the light incident surface side of the photoelectric conversion part; and an electron barrier layer formed between the photoelectric conversion part and the transparent electrode. |
