发明名称 METHOD FOR MEASURING THICKNESS OF LAYER APPLIED FROM COSMETIC MATERIAL USING SKIN CONTOUR
摘要 A method for measuring the thickness of a cosmetic material-applied layer using skin curves comprises the following steps: a step of measuring curve data of a skin area which includes a first area without a cosmetic material-applied layer, and a second area with a cosmetic material-applied layer; a step of generating a 3D image of the skin area from the curve data; a step of determining a line profile area, which crosses the boundary line between the first area and the second area, in the 3D image; and a step of calculating the thickness of the cosmetic material-applied layer using a height difference according to the line profile area. By using the method for measuring the thickness of a cosmetic material-applied layer, the thickness of a cosmetic material-applied layer or a make-up-applied layer can be accurately and numerically assessed.
申请公布号 KR20140083416(A) 申请公布日期 2014.07.04
申请号 KR20120153131 申请日期 2012.12.26
申请人 AMOREPACIFIC CORPORATION 发明人 JEONG, CHOON BOK;PARK, SE JUN;HAN, JI YEON;KIM, HYE RIM;NAM, GAE WON;CHO, JUN CHEOL
分类号 G01B11/06;G01B11/24 主分类号 G01B11/06
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