发明名称 |
METHOD FOR MEASURING THICKNESS OF LAYER APPLIED FROM COSMETIC MATERIAL USING SKIN CONTOUR |
摘要 |
A method for measuring the thickness of a cosmetic material-applied layer using skin curves comprises the following steps: a step of measuring curve data of a skin area which includes a first area without a cosmetic material-applied layer, and a second area with a cosmetic material-applied layer; a step of generating a 3D image of the skin area from the curve data; a step of determining a line profile area, which crosses the boundary line between the first area and the second area, in the 3D image; and a step of calculating the thickness of the cosmetic material-applied layer using a height difference according to the line profile area. By using the method for measuring the thickness of a cosmetic material-applied layer, the thickness of a cosmetic material-applied layer or a make-up-applied layer can be accurately and numerically assessed. |
申请公布号 |
KR20140083416(A) |
申请公布日期 |
2014.07.04 |
申请号 |
KR20120153131 |
申请日期 |
2012.12.26 |
申请人 |
AMOREPACIFIC CORPORATION |
发明人 |
JEONG, CHOON BOK;PARK, SE JUN;HAN, JI YEON;KIM, HYE RIM;NAM, GAE WON;CHO, JUN CHEOL |
分类号 |
G01B11/06;G01B11/24 |
主分类号 |
G01B11/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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