发明名称 FINDING OPTIMAL READ THRESHOLDS AND RELATED VOLTAGES FOR SOLID STATE MEMORY
摘要 An expected value associated with stored values in solid state storage, as well as a set of three or more points are obtained where the three or more points include a voltage and a value associated with stored values. Two points having ratios closest to the expected value are selected from the set. A voltage is determined based at least in part on the selected two points and the expected value.
申请公布号 KR20140084298(A) 申请公布日期 2014.07.04
申请号 KR20147014174 申请日期 2012.12.03
申请人 SK HYNIX MEMORY SOLUTIONS INC. 发明人 TANG XIANGYU;ZENG LINGQI;BELLORADO JASON;LEE FREDERICK K.H.;SUBRAMANIAN ARUNKUMAR
分类号 G06G7/48 主分类号 G06G7/48
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