发明名称 |
SEMICONDUCTOR DEVICE MANUFACTURING METHOD AND SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device manufacturing method which can ensure removal of an unintended impurity adhering to a semiconductor substrate with etching of the semiconductor substrate and which enables elaborate designing of a concentration profile of an impurity of the semiconductor substrate; and provide a semiconductor device manufactured by the manufacturing method.SOLUTION: A semiconductor device manufacturing method comprises: a process of a first semiconductor region including an active element for controlling a current flowing in a surface of a substrate in a thickness direction of the substrate; a process of grinding a rear face of the substrate; a first etching process of etching the rear face of the substrate after grinding by a phosphorous-containing medicinal solution; a second etching process of etching the rear face after the first etching by an etching method of an etching rate lower than that of the first etching; and a process of implanting an impurity from the rear face of the substrate after the second etching to form a second semiconductor region where a current flows. |
申请公布号 |
JP2014123681(A) |
申请公布日期 |
2014.07.03 |
申请号 |
JP20120280071 |
申请日期 |
2012.12.21 |
申请人 |
LAPIS SEMICONDUCTOR CO LTD |
发明人 |
YOSHINARI MASATAKA |
分类号 |
H01L21/336;H01L29/739;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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