发明名称 SEMICONDUCTOR DEVICE MANUFACTURING METHOD AND SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device manufacturing method which can ensure removal of an unintended impurity adhering to a semiconductor substrate with etching of the semiconductor substrate and which enables elaborate designing of a concentration profile of an impurity of the semiconductor substrate; and provide a semiconductor device manufactured by the manufacturing method.SOLUTION: A semiconductor device manufacturing method comprises: a process of a first semiconductor region including an active element for controlling a current flowing in a surface of a substrate in a thickness direction of the substrate; a process of grinding a rear face of the substrate; a first etching process of etching the rear face of the substrate after grinding by a phosphorous-containing medicinal solution; a second etching process of etching the rear face after the first etching by an etching method of an etching rate lower than that of the first etching; and a process of implanting an impurity from the rear face of the substrate after the second etching to form a second semiconductor region where a current flows.
申请公布号 JP2014123681(A) 申请公布日期 2014.07.03
申请号 JP20120280071 申请日期 2012.12.21
申请人 LAPIS SEMICONDUCTOR CO LTD 发明人 YOSHINARI MASATAKA
分类号 H01L21/336;H01L29/739;H01L29/78 主分类号 H01L21/336
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