发明名称 TESTING SYSTEM WITH AN ISOLATED SWITCHING MODULE
摘要 In this invention, a test system includes a tester and a switching module for connecting any pin to the tester for testing a device-under-test (DUT), the test system has a rectifying device between the ground of the DUT and the ground of the switching module in order to isolate the DUT from the switching module, thereby blocking unwanted current flowing between the DUT and the switching module to ensure the correctness of the testing.;Since the ground of the switching module is not directly connected to the ground of the DUT and the tester, the rectifying device will keep the voltage difference between the ground of the switching module and the DUT in a range between zero and the cut-in voltage of the rectifying device, thereby allowing single-ended signals to be used between the switching module and the tester or the DUT.
申请公布号 US2014184240(A1) 申请公布日期 2014.07.03
申请号 US201213731012 申请日期 2012.12.30
申请人 CHEN CHING-TSUNG;CHEN WEICHUNG 发明人 CHEN CHING-TSUNG;CHEN WEICHUNG
分类号 G01R1/20 主分类号 G01R1/20
代理机构 代理人
主权项 1. A system for testing a DUT having a first ground and a plurality of I/O pins, comprising: a switching module having a second ground, comprising a conductive path configured to conduct a first pin out of the plurality of I/O pins of the DUT to a second pin of the switching module; a tester having a third ground, connected to the conductive path; and a first rectifying device having a first positive terminal and a first negative terminal, wherein the first ground of the DUT and the third ground of the tester are electrically coupled to each other; the first positive terminal is electrically coupled to the second ground of the switching module; and the first negative terminal is electrically coupled to the first ground of the DUT.
地址 New Taipei City TW