| 摘要 |
<p>The purpose of the present invention is to provide a new inspection device. This inspection device comprises: a lighting unit which applies light to an object of which an image is to be captured; an image capturing unit which receives reflected light from the object, the reflected light being based on the application of the light; and an image capturing element which is present in the image capturing unit and receives the reflected light. Further, the inspection device is an inspection device for acquiring a two-dimensional image and/or a three-dimensional image of the object. A polarizer is installed between the lighting unit and the object, and an analyzer is installed between the object and the image capturing element. The occurrence of a difficult-to-identify area in the two-dimensional image and/or the three-dimensional image is suppressed. Furthermore, an image capture area is provided in the image capturing element, and the image capture area receives the reflected light. A band-pass filter is provided on the image capture area.</p> |
