发明名称 |
HIGH VOLTAGE OPEN-DRAIN ELECTROSTATIC DISCHARGE (ESD) PROTECTION DEVICE |
摘要 |
A high voltage open-drain electrostatic discharge (ESD) protection device is disclosed, which comprises a high-voltage n-channel metal oxide semiconductor field effect transistor (HV NMOSFET) coupled to a high-voltage pad and a low-voltage terminal and receiving a high voltage on the high-voltage pad to operate in normal operation. The high-voltage pad and the HV NMOSFET are further coupled to a high-voltage ESD unit blocking the high voltage, and receiving a positive ESD voltage on the high-voltage pad to bypass an ESD current when an ESD event is applied to the high-voltage pad. The high-voltage ESD unit and the low-voltage terminal are coupled to a power clamp unit, which receives the positive ESD voltage via the high-voltage ESD unit to bypass the ESD current. |
申请公布号 |
US2014185167(A1) |
申请公布日期 |
2014.07.03 |
申请号 |
US201313733712 |
申请日期 |
2013.01.03 |
申请人 |
AMAZING MIRCOELECTRONIC CORP. |
发明人 |
PENG James Jeng-Jie;CHEN Chih-Hao;JIANG Ryan Hsin-Chin |
分类号 |
H02H9/04 |
主分类号 |
H02H9/04 |
代理机构 |
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代理人 |
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主权项 |
1. A high voltage open-drain electrostatic discharge (ESD) protection device, comprising:
a first high-voltage n-channel metal oxide semiconductor field effect transistor (HV NMOSFET) coupled to a high-voltage pad and a low-voltage terminal and receiving a high voltage on said high-voltage pad to operate in a normal operation; a high-voltage ESD unit coupled to said high-voltage pad and said first HV NMOSFET, blocking said high voltage, and receiving a positive ESD voltage or a negative ESD voltage on said high-voltage pad to bypass a first ESD current or a second ESD current respectively when an ESD event is applied to said high-voltage pad; and a first power clamp unit coupled to said high-voltage ESD unit and said low-voltage terminal, and receiving said positive ESD voltage via said high-voltage ESD unit to bypass said first ESD current. |
地址 |
New Taipei City TW |