发明名称 ETALON-BASED WAVELEGNTH LOCKING APPARATUS AND ALIGNMENT METHOD
摘要 Consistent with the present disclosure, an apparatus for producing a control signal for a laser source is provided, comprising an etalon configured to receive light from the laser source and control circuitry that provides the control signal, wherein the control signal is indicative of a comparison of (a) a difference between a forward transmission signal of the etalon and a backward reflection signal of the etalon and (b) the light received by the etalon from the laser source. Alternatively, the control signal is indicative of a comparison of (a) a difference between a forward transmission signal of the etalon and a backward reflection signal of the etalon and (b) a combination of the forward transmission signal of the etalon and the backward reflection signal of the etalon. Also consistent with the present disclosure, a method of aligning an etalon-based wavelength locking apparatus is provided, wherein the etalon of the apparatus is aligned with an optical axis along a direction of propagation of the output of the laser source by monitoring the signals indicative of the forward transmission signal and the backward reflection signal of the etalon.
申请公布号 US2014185045(A1) 申请公布日期 2014.07.03
申请号 US201213732100 申请日期 2012.12.31
申请人 Han Xiaofeng;Butrie Tim;Coult David 发明人 Han Xiaofeng;Butrie Tim;Coult David
分类号 G01J1/16;G01B11/27 主分类号 G01J1/16
代理机构 代理人
主权项 1. An apparatus for producing a control signal for a laser source, comprising: an etalon configured to receive light from the laser source; a first detector that detects a forward transmission signal of the etalon to provide a first signal; a second detector that detects a backward reflection signal of the etalon to provide a second signal; a third detector that detects the light from the laser source to provide a third signal; and circuitry that provides the control signal based on the first signal, the second signal and the third signal.
地址 Allentown PA US