发明名称 Raised Source/Drain MOS Transistor and Method of Forming the Transistor with an Implant Spacer and an Epitaxial Spacer
摘要 A raised source/drain MOS transistor is formed in a process that utilizes a first sidewall spacer when implanting a semiconductor region to form the heavily-doped source region and the heavily-doped drain region of the transistor, and a second different sidewall spacer when epitaxially growing the raised source region and the raised drain region of the transistor.
申请公布号 US2014183663(A1) 申请公布日期 2014.07.03
申请号 US201213729282 申请日期 2012.12.28
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 Song Seung-Chul;Blatchford James W.;Lim Kwan-Yong
分类号 H01L29/78;H01L29/66 主分类号 H01L29/78
代理机构 代理人
主权项 1. A semiconductor structure comprising: a semiconductor region having a conductivity type; a source having a conductivity type that is opposite to the conductivity type of the semiconductor region, and including a lightly-doped source region that touches the semiconductor region, a heavily-doped source region that touches the lightly-doped source region, and a raised source region that touches the heavily-doped source region, the heavily-doped source region having a width, the raised source region having a width, the width of the raised source region being greater than the width of the heavily-doped source region; a drain having a conductivity type that is opposite to the conductivity type of the semiconductor region, and including a lightly-doped drain region that touches the semiconductor region, a heavily-doped drain region that touches the lightly-doped drain region, and a raised drain region that touches the heavily-doped drain region; a channel region of the semiconductor region lying laterally between the source and the drain; a gate dielectric touching and lying over the channel region; and a gate touching and lying over the gate dielectric.
地址 Dallas TX US