发明名称 SEMICONDUCTOR DEVICE INCLUDING A FLOATING GATE
摘要 A semiconductor device includes a semiconductor layer with a trench dug downward from its surface, a source region formed on a surface layer portion adjacent to a first side of the trench in a prescribed direction, a drain region formed on the surface layer portion, adjacent to a second side of the trench opposite to the first side in the prescribed direction, a first insulating film on the bottom surface and the side surface of the trench, a floating gate stacked on the first insulating film and opposed to the bottom surface and the side surface of the trench through the first insulating film, a second insulating film formed on the floating gate, and a control gate at least partially embedded in the trench so that the portion embedded in the trench is opposed to the floating gate through the second insulating film.
申请公布号 US2014183616(A1) 申请公布日期 2014.07.03
申请号 US201414201233 申请日期 2014.03.07
申请人 ROHM CO., LTD. 发明人 IZUMI Naoki
分类号 H01L29/788 主分类号 H01L29/788
代理机构 代理人
主权项 1. A semiconductor device comprising: a semiconductor layer; a trench dug downward from the surface of the semiconductor layer; a source region formed on the surface layer portion of the semiconductor layer adjacently to a first side of the trench in a prescribed direction; a drain region formed on the surface layer portion of the semiconductor layer adjacently to a second side of the trench opposite to the first side in the prescribed direction; a first insulating film formed on the bottom surface and the side surface of the trench, the first insulating film having a thin portion having a relatively small thickness and a thick portion having a relatively large thickness formed by the remaining portion of the first insulating film other than the thin portion; a floating gate stacked on the first insulating film and opposed to the bottom surface and the side surface of the trench through the first insulating film; a second insulating film formed on the floating gate; and a control gate at least partially embedded in the trench so that the portion embedded in the trench is opposed to the floating gate through the second insulating film.
地址 Kyoto JP