发明名称 DRY ETCHING METHOD
摘要 The present invention is a method for etching a multilayer laminated film containing at least one silicon oxide film layer and at least one silicon nitride film layer with use of an etching gas so that the layers are etched at the same time, said etching method being characterized in that the etching gas contains a chain saturated fluorinated hydrocarbon compound represented by the following formula (1): CxHyFz (wherein x is 4, y is an integer of 4 or more, z is a positive integer, and y + z is 10). According to the present invention, high selectivity with respect to a mask and a good pattern shape can be achieved without obstructing a hole with a deposited film even in etching of a multilayer laminated film.
申请公布号 WO2014104290(A1) 申请公布日期 2014.07.03
申请号 WO2013JP85091 申请日期 2013.12.27
申请人 ZEON CORPORATION 发明人 INUI HIROTOSHI
分类号 H01L21/3065 主分类号 H01L21/3065
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